Gently measure minuscule electronic components (0201 size) with functionality for limiting the applied voltage
By limiting the voltage that is applied during measurement to 5 V or less, the RM3542A makes it possible to measure 0201-size components that have low rated voltages without stressing the parts.
Ensure reliable contact quickly with the contact improvement function
The RM3542A improves contact with measurement specimens by eliminating oxide films and dirt between the probes and specimens. By addressing faulty contact, the instrument facilitates stable measurement and reduces the contact error rate, boosting productivity.
Utilize a more evolved contact improvement function in low-power measurement
The RM3542A allows contact improvement to be used in a broader range of situations, for example testing of compact ferrite beads and minuscule, 0201-size resistors, by limiting the inrush current that flows to the measurement specimen during operation of the function.
Use the scaling function to correct measurements as if the target component were mounted
The RM3542A’s scaling function can correct for the difference in resistance values that are obtained when testing a given component alone and when it is mounted on a circuit board (due to the factors such as the effects of probing position). This feature is useful when testing low-resistance current-sensing resistors such as shunts.
Gently measure minuscule electronic components (0201 size) with functionality for limiting the applied voltage
By limiting the voltage that is applied during measurement to 5 V or less, the RM3542A makes it possible to measure 0201-size components that have low rated voltages without stressing the parts.
Ensure reliable contact quickly with the contact improvement function
The RM3542A improves contact with measurement specimens by eliminating oxide films and dirt between the probes and specimens. By addressing faulty contact, the instrument facilitates stable measurement and reduces the contact error rate, boosting productivity.
Utilize a more evolved contact improvement function in low-power measurement
The RM3542A allows contact improvement to be used in a broader range of situations, for example testing of compact ferrite beads and minuscule, 0201-size resistors, by limiting the inrush current that flows to the measurement specimen during operation of the function.
Use the scaling function to correct measurements as if the target component were mounted
The RM3542A’s scaling function can correct for the difference in resistance values that are obtained when testing a given component alone and when it is mounted on a circuit board (due to the factors such as the effects of probing position). This feature is useful when testing low-resistance current-sensing resistors such as shunts.
Gently measure minuscule electronic components (0201 size) with functionality for limiting the applied voltage
By limiting the voltage that is applied during measurement to 5 V or less, the RM3542A makes it possible to measure 0201-size components that have low rated voltages without stressing the parts.
Ensure reliable contact quickly with the contact improvement function
The RM3542A improves contact with measurement specimens by eliminating oxide films and dirt between the probes and specimens. By addressing faulty contact, the instrument facilitates stable measurement and reduces the contact error rate, boosting productivity.
Utilize a more evolved contact improvement function in low-power measurement
The RM3542A allows contact improvement to be used in a broader range of situations, for example testing of compact ferrite beads and minuscule, 0201-size resistors, by limiting the inrush current that flows to the measurement specimen during operation of the function.
Use the scaling function to correct measurements as if the target component were mounted
The RM3542A’s scaling function can correct for the difference in resistance values that are obtained when testing a given component alone and when it is mounted on a circuit board (due to the factors such as the effects of probing position). This feature is useful when testing low-resistance current-sensing resistors such as shunts.
Basic specifications (Accuracy guaranteed for 1 year, Post-adjustment accuracy guaranteed for 1 year)
| Resistance range |
[at Low Power OFF] 100 mΩ range (Max. 120.0000 mΩ, 0.1 μΩ resolution) to 100 MΩ range (Max. 120.0000 MΩ, 100 Ω resolution), 16 steps
[at Low Power ON] 1000 mΩ range (Max. 1200.000 mΩ, 1 μΩ resolution) to 1000 Ω range (Max. 1200.000 Ω, 1 mΩ resolution), 6 steps |
| Display |
Monochrome graphic LCD 240 × 64 dot, white LED backlight |
| Measurement accuracy |
[with SLOW mode, at 100 mΩ range] ±0.015 % rdg. ±0.002 % f.s.
[with SLOW mode, at 1000 Ω range] ±0.006 % rdg. ±0.001 % f.s. (best case) |
| Testing current |
[at 100 mΩ range] 100 mA DC to [at 100 MΩ range] 100 nA DC |
| Open-terminal voltage |
20 V DC max. (with applied voltage limit function enabled: max. 10 V DC) |
| Sampling rate |
FAST, MEDIUM, SLOW, 3 settings |
| Measurement times |
[at 100 Ω /1000 Ω ranges, with Low Power OFF]
FAST: 0.9 ms, MED: 3.6 ms, SLOW: 17 ms (minimum time) |
| Integration time |
0.1 ms to 100.0 ms, or 1 to 5 PLC at 50 Hz, 1 to 6 PLC at 60 Hz
Note: PLC = one power line cycle (mains wave-form period) |
| Other functions |
Comparator (compare setting value with measurement value), Delay (set to allow for mechanical delay of trigger input and probing, or set to allow for measurement object response), Applied Voltage Limit Function, Scaling Function, OVC (offset voltage compensation), Measurement fault detection, Probe short-circuit detection, Improve contact, Auto-memory, Statistical calculations, Settings monitor (when using two instruments, a difference in settings causes warning notification), Retry, Trigger function. etc,. |
| Interfaces |
RS-232C, Printer, GP-IB (Model RM3542-51) |
| External I/O |
Trigger, Hold input, Comparator output, Settings monitor terminal |
| Power supply |
100 to 240 V AC, 50/60 Hz, 30 VA max. |
| Dimensions and mass |
260 mm (10.24 in) W × 88 mm (3.46 in) H × 300 mm (11.81 in) D, 2.9 kg (102.3 oz) |
| Accessories |
Power cord ×1, EXT. I/O male connector ×1, Instruction manual ×1, Operation guide ×1
|
Options
Probe and Test fixtures
SMD TEST FIXTURE IM9100
• Direct connection type • SMDs with electrodes on the bottom • DC to 8MHz • Measurable sample sizes: 01005 to 0402 (EIA)
Learn more
TEST FIXTURE 9262
Direct connection type, DC to 8 MHz, measurable conductor diameter: ø0.3 (0.01 in) to 2 mm (0.08 in)
SMD TEST FIXTURE 9263
Direct connection type, DC to 8 MHz, Test sample dimensions:1 mm (0.04 in) to 10 mm (0.39 in)
4-TERMINAL PROBE 9140-10
Cable length 1 m (3.28 ft), DC to 200 kHz, impedance characteristics of 50 Ω, 4-terminal pair configuration, measurable conductor diameter: ø0.3 (0.01 in) to 5 mm (0.20 in)
PC communication
RS-232C CABLE 9637
9 pin - 9 pin, cross, 1.8 m (5.91 ft) length
GP-IB CONNECTOR CABLE 9151-02
2 m (6.56 ft) length
